dP-Defect™
dP-Defect combines a comprehensive data management system with a powerful and intuitive mapping interface. The dP-Defect interface allows the display of defects by any wafer/layer combination —including multiple wafer and multiple layer display. Defects can be mapped by defect size, classification, clustering, layer of origin, defect type, etc. Defect images stored in the database can also be displayed on the mapping interface, related to their coordinates and layer of origin.

In addition to the map view, a comprehensive data table provides statistics such as defect density, kill ratio, chi-square, yield impact, etc. Because dP-Defect is fully integrated with the complete dataPOWER software suite, the full array of dataPOWER analysis tools can be applied to the defect data.

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dP-bitMAP™
dP-bitMAP is a bit analysis and mapping tool for memory yield management of both stand-alone memory devices as well as embedded memory such as SoCs.
dP-bitMAP has a dedicated database allowing retrieval of bit fault (failure) data by product, program, parameter, lot ID, wafer ID and memory type.

Full dataPOWER retrieval functionality and SQL query customization are integrated into bitMAP. After retrieval, the dP-bitMAP gallery displays memory records matching your retrieval criteria, with bit failures displayed individually or in groups. These interactive maps and associated information can be used to enhance and optimize device yield related to memory bit failures. All bit failure images can be viewed in multiple combinations of classification, memory type or parameter.

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